grazing incidence

A stigmatic grazing incidence grating spectrograph and laser plasma XUV emission spectra

消像散掠入射光栅光谱仪和激光等离子体极紫外发射光谱

The local structures of Pt thin films grown by molecular beam epitaxy with the thickness range from 3 to 105 nm have been studied by the grazing incidence fluorescence XAFS technique.

利用荧光X射线吸收精细结构（XAFS）技术研究了厚度为3&105nm范围的分子束外延生长的Pt金属薄膜的局域结构。

Using ray tracing code and optical path function, optimization calculation is carried out on a grazing incidence soft x ray flat field spectrometer with toroidal mirror as prepositive optic system.

采用光线追踪和光路函数的方法，优化设计了具有超环面镜的前置光学系统的掠入射软x射线平场谱仪，得到了谱仪的谱分辨和空间分辨本领。

Formula for Calculating Spectral Bandwidth of Grazing Incidence Dye Laser

掠入射染料激光器线宽计算公式