In this dissertation, a large number of real defects are obtained from the IC. IC defect detection, feature extraction and classification and its influence on signal integrity and MTTF ( Median-Time-To-Fail, MTTF) of IC are studied in detailed.

  • 本文将从IC电路中获取大量的真实缺陷,系统、深入地研究IC缺陷的检测、缺陷的特征提取和分类、缺陷对电路信号完整性的影响以及缺陷对IC中位寿命的影响。

  • 互联网摘选 2026-07-12 11:29:40

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