Crater-Visible under diffused illumination, a surface imperfection on a wafer that can be distinguished individually.
微坑-在扩散照明下可见的,晶圆片表面可区分的缺陷。
Crater-Visible under diffused illumination, a surface imperfection on a wafer that can be distinguished in!
微坑 - 在扩散照明下可见的, 晶圆片表面可区分的缺陷.
The imperfection shows up even more on a polished surface.
这瑕疵在擦光的表面更加显眼了.
Role of the cavity field, the electrostatic repulsive force at the doma-in boundary and self-enhanced diffraction light induced by physical imperfection on laser-induced surface damage are discussed.
本文讨论了由晶体缺陷所致的自增强衍射光,富集于缺陷的空间电荷所致的空洞场,以及由此场导致的发生在畴界上的静电斥力对此损伤所起的作用。
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