testability的例句大全

Ready testability design for logic circuits

逻辑电路易测性设计探讨

Air-to-Air Missile's Testability Design Based on BST

基于BST的空空导弹测试性设计

Testability Design for Programmable Logic Arrays

可编程逻辑阵列的易测性设计

Design for test is an important process in the chip design nowadays, testability design of wireless chip needs a much higher requirement of test technology.

可测试性设计是现代芯片设计中的关键环节，针对无线接入芯片的可测试性设计对测试技术有更高的要求。

According to the software function and implementation of the general-purpose ATS for missile weapon systems, the analysis and study of testability design is given.

针对导弹通用自动测试系统的功能与实现，对系统的软件部分进行可测试性设计分析研究。

This paper presents the important action of the simulation fault injection in the testability design, and the important steps to complete the testability design using the simulation.

论述了仿真故障注入在测试性设计中的重要作用以及利用仿真进行测试性设计的几个重要环节。

BIT is one important testability design of electronic systems. It's also one important way to test and insulate the failure in the electronic system or the internal equipment.

BIT（自检）是电子系统可测试性设计的重要组成部分，是电子系统或设备内部检测和隔离故障的重要手段。

How to determine the best test-points in faults diagnosis of dynamical systems is a very important problem and it is the main content of testability design.

在动态系统故障诊断中，如何选择测试位置是一个非常重要的问题，它是系统可测性设计的重要内容。

The experimental results confirmed that BIST testability design is feasible and practical. The design is a practical reference to electronic systems BIST and fault diagnosis strategy.

实验研究结果证实了本文提出的内建自测试可测性设计的有效性和实用性，对电子系统内建自测试及其故障诊断策略具有借鉴意义。

Which lay the foundation for the boundary-scan test system' development. 2, Explore and design the testability design which are based on boundary scanning technique and MTM maintain bus technique.

为边界扫描测试系统的开发奠定基础。2、探索并设计了基于边界扫描技术和MTM维修总线技术的电路板板级和电子设备系统级的可测性设计，对电路设计人员具有可借鉴作用。

In this paper the concept of Built in Test ( BIT) is introduced, a method for the testability design of avionic integrated equipment is proposed with emphasis on the BIT design of major parts.

本文介绍了机内自动测试（BIT）的基本概念，提出了一种解决航空电子综合化设备测试性设计的方法，并对设备中主要部分的BIT设计作了详细的阐述。

In this paper, the DFT standards series based on standard test bus are analyzed, and the testability design methods of applying boundary scan technology in board level test, system level test and products field maintenance are put forward.

在分析基于标准测试总线的测试性技术的标准体系之后，介绍了将边界扫描技术应用于板级测试，系统级测试以及产品现场维护的测试性设计的一种方法。

During system design phase, we can use DRR model to go on testability design. By redefining the cardinality of set, we establish the relationship between the domain/ range ratio and the testability metric.

在系统设计阶段可以运用DRR模型进行可测试性度量，本文对集合的势进行了重新的定义，在此基础上建立了定义域和值域的势的比值与软件的可测试度之间的关系。

The vertical test testability design requests ensure the consistency and compatibility for test and diagnosis during the whole life cycle of weapon equipments. The study is important to improve the testability level and realize integral test for the weapon equipments.

纵向测试性设计要求保证了武器装备全寿命周期测试诊断的一致性和兼容性，该研究对提高武器装备的测试性水平和实现武器装备一体化测试，具有重要意义。

In this paper, a new synthesis method for the testability design of digital circuits is proposed, so that the testability design of the circuits is achieved automatically by means of solving a corresponding mathematical programming problems in the course of logical design.

文章借助于数学规划手段完成了数字电路可测试性的自动设计，使电路在设计阶段就能保证有一定的可测试性。

The experiment on one benchmark circuit demonstrates that the method has features as follows: it only needs a single QR factorization applied to the testability matrix of the circuit under test and a few matrix computations.

通过一个benchmark电路验证该方法仅需对被测电路的可测性矩阵进行一次QR分解和较少次数的矩阵运算；

Since the chip has interior SRAM and it's difficult and slow to test SRAM exteriorly, in Chapter Four we use the technique of BIST in Design of testability of SRAM, which makes it possible to test the memory at normal working speed.

由于片内有SRAM，而SRAM的片外测试比较困难且速度较慢，所以文中第四章采用BIST技术对SRAM进行了可测性设计，完成后可以用正常的工作速度对存储器进行测试。

Inaccuracies in the present proportionate stratified sampling algorithm based on fuzzy failure rate data is one main cause which makes the testability demonstration results untrustworthy.

现有的分层抽样算法中故障率数据不准确是导致测试性验证试验结果不可信的一个原因。

Design for Testability and Automatic Test Generation Techniques for Digital IC ′ s

数字IC可测性设计和自动测试生成技术

Design by contract is an important approach to design for testability of software.

合约式设计是一种重要的软件易测试性设计方法。